Course: Diagnostics of Digital Systems

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Course title Diagnostics of Digital Systems
Course code AUEM/A9DCS
Organizational form of instruction Lecture + Tutorial
Level of course Master
Year of study not specified
Semester Winter
Number of ECTS credits 5
Language of instruction Czech
Status of course Compulsory
Form of instruction Face-to-face
Work placements This is not an internship
Recommended optional programme components None
  • Neumann Petr, Ing. Ph.D.
  • Skočík Petr, Ing.
  • Perůtka Karel, Ing. Ph.D.
  • Plšek Stanislav, Ing.
Course content
- Introduction to pragmatic aspects of diagnostics. Technological aspects of diagnostics. Basic terms of diagnostics. - Testing of electronic components, Analogue and digital circuit testing, Fault models. - Digital circuit testing - Structural tests, fault activation and fault propagation, D-algorithm and its modifications. - Digital circuit testing - Functional tests, Random and pseudorandom tests, Sequential circuits testing. - Memory diagnostics, memory varieties and their structure, Memory test patterns and their fault coverage, I/O circuit diagnostics. - VLSI circuit diagnostic, technological aspects, failure sources, test methods. - Burn-In test and Life test. - Reliability, Terminology, Object reliability models, Reliability of components, subsystems, and systems, Reliability assessment related to the object reliability-wise internal structure. - ATE principles and structure, PCB testing, In-Circuit-Testing. - ATPG, Test minimization, Pseudo-trivial tests, Protection against failures. - Diagnostic data compression, Signature analysis . - Design for test - DFT, Built-In-Self Test principles. - Embeded support for diagnostics - Boundary Scan, IEEE 1149.x Standard, Test options and variants with embeded support for diagnostics. - SMT - Surface Mount Technology, Principles, Component packages, Involved technologies and equipments, MDA - Manufacturing Defect Analysis.

Learning activities and teaching methods
Observation, Demonstration, Simple experiments, Exercises on PC
  • Participation in classes - 28 hours per semester
Learning outcomes
The subject is aimed at gaining knowledge about diagnostic methods in electronics, about its theoretical basis and about the technical support for diagnostics. The particular emphasis is aimed at digital circuits and at very large scale integrated circuits. Students will acquire knowledge about diagnostic approaches oriented at typical failures in electronics, about life tests, and about reliability evaluation for components and assemblies. The subject covers the technological aspect of diagnostics as well.
After completion of this subject, students are oriented in the field of diagnostics and testing in electronics. They are able to use basic diagnostic approaches and methods, and develop them further providing to work in production or development branch.
The prerequisite for this subject is a successful completion of subjects in physics, in electrical engineering and in electronic.

Assessment methods and criteria
Grade (Using a grade system), Oral examination, Analysis of the student's performance, Preparation of a presentation

Students have to pass laboratory excercises and submit relevant protocols, or in case of individual study, the student in question has to complete a thematic project. The subject is concluded with a viva based on a random choice of two themes and a written preparation.The result of a subject examination is expressed on a six-point scale: A "výborně" (i.e. "excellent"), B "velmi dobře" (i.e. "very good"), C "dobře" (i.e. "good"), D "uspokojivě" (i.e. "satisfactory"), E "dostatečně" (i.e. "sufficient"), F "nedostatečně" (i.e. "fail").
Recommended literature
  • Focus on In-Circuit Testing. Firemní literatura GenRad. GenRad, 1998.
  • Bushnell, M.L., Agrawal, V.D. Essentials of Electronic Testing for Digital Memory and Mixed- Signal VLSI Circuits. Springer, 2004.
  • Časopisy. Journal of Electronic Testing (Publisher: Kluwer Academic Publishers).
  • Časopisy. Sdělovací technika (ČR), Electronic Design (USA), Computer Design (USA), Elektronik (SRN).
  • Drábek, V. Spolehlivost a diagnostika. Brno : VUT, 1986.
  • Hlavička, J., a kol. Diagnostika elektronických číslicových obvodů. Praha : SNTL, 1982.
  • Hlavička, J. a kol. Diagnostika mikroprocesorových systémů. Praha : ČSVTS, 1985.
  • Hlavička, J. Diagnostika a spolehlivost. ČVUT Praha, 1998.
  • Hlavička, J. Spolehlivost a diagnostika. Praha : ČVUT, 1989.
  • Jha, N. K., Gupta, S. Testing of Digital Systems. Cambridge University Preses, 2003.
  • Maunder, S. The Board Designer´s Guide to Testable Logic Circuits. Addison-Wesley Publ. Comp., 1992.
  • Miczo, A. Digital Logic Testing and Simulation. John Wiley & Sons, 2003.
  • Navrátil, Z., Tobola, P. Diagnostika číslicových systémů. Praha : Mezinárodní organizace novinářů, 1991. ISBN 80-214-0254-7.

Study plans that include the course
Faculty Study plan (Version) Branch of study Category Recommended year of study Recommended semester
Faculty of Applied Informatics Computer and Communication Systems (10) Special and interdisciplinary fields 2 Winter